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KMID : 0381920120420040218
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Korean Journal of Microscopy
2012 Volume.42 No. 4 p.218 ~ p.222
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Atomic Resolution Imaging of Rotated Bilayer Graphene Sheets Using a Low kV Aberration-corrected Transmission Electron Microscope
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Ryu Gyeong-Hee
Park Hyo-Ju
Kim Na-Yeon
Lee Zong-Hoon
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Abstract
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Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic confi guration of bilayer graphene with a rotation angle can be identifi ed from the direct imaging and phase reconstructed imaging since atomic resolution Moir? pattern can be obtained successfully at atomic scale using an aberrationcorrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic confi guration of stacked graphene layers readily.
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KEYWORD
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Bilayer graphene, Aberration-corrected TEM imaging, Atomic resolution, Low kV imaging, Simulation
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